000 | 03284cam a2200349Ii 4500 | ||
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001 | on1245493806 | ||
003 | OCoLC | ||
005 | 20240726104839.0 | ||
008 | 210408s2021 mau o 000 0 eng d | ||
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_aIEEEE _beng _erda _epn _cIEEEE _dOCLCO _dOCLCF _dZ5A _dUKAHL _dNT |
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_a9781630818616 _q((electronic)l(electronic)ctronic) |
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050 | 0 | 4 |
_aTK7868 _b.P333 2021 |
049 | _aMAIN | ||
100 | 1 |
_aBrooks, Douglas, _d1940- _e1 |
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245 | 1 | 0 | _aPCB design guide to via and trace currents and temperatures /Douglas Brooks with Johannes Adam. |
300 | _a1 online resource | ||
336 |
_atext _btxt _2rdacontent |
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_acomputer _bc _2rdamedia |
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_aonline resource _bcr _2rdacarrier |
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_adata file _2rda |
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_tIntroduction and Historical Background -- _tMaterials Used in PCBs -- _tResistivity and Resistance -- _tTrace Heating and Cooling -- _tIPC Curves -- _tThermal Simulations -- _tThermal Simulations -- _tVia Temperatures -- _tCurrent Densities in Vias -- _tThinking Outside the Boxes -- _tFusing Currents: Background -- _tFusing Currents: Analyses -- _tDo Traces Heat Uniformly? -- _tStop Thinking about Current Density -- _tAC Currents -- _tIndustrial CT (X-Ray) Scanning -- _tMeasuring Thermal Conductivity -- _tMeasuring Resistivity -- _tIPC Internal and Vacuum Curves Fitted wi -- _tCurrent/Temperature Curves, 0.25 to 5.0 -- _tCurrent Density in Vias -- _tDerivation of Onderdonk's Equation -- _tResults of All Six Fusing Configuration -- _tNonuniform Heating Patterns. |
520 | 0 | _aA very important part of printed circuit board (PCB) design involves sizing traces and vias to carry the required current. This exciting new book will explore how hot traces and vias should be and what board, circuit, design, and environmental parameters are the most important. PCB materials (copper and dielectrics) and the role they play in the heating and cooling of traces are covered. The IPC curves found in IPC 2152, the equations that fit those curves and computer simulations that fit those curves and equations are detailed. Sensitivity analyses that show what happens when environments are varied, including adjacent traces and planes, changing trace lengths, and thermal gradients are presented. Via temperatures and what determines them are explored, along with fusing issues and what happens when traces are overloaded. Voltage drops across traces and vias, the thermal effects going around right-angle corners, and frequency effects are covered. Readers learn how to measure the thermal conductivity of dielectrics and how to measure the resistivity of copper traces and why many prior attempts to do so have been doomed to failure. Industrial CT Scanning, and whether or not they might replace microsections for measuring trace parameters are also considered. | |
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650 | 0 |
_aPrinted circuits _xDesign and construction. |
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655 | 1 | _aElectronic Books. | |
700 | 1 |
_aAdam, Johannes, _e1 |
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856 | 4 | 0 |
_zClick to access digital title | log in using your CIU ID number and my.ciu.edu password. _uhttpss://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2945408&site=eds-live&custid=s3260518 |
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_c80321 _d80321 |
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_a1 _bCynthia Snell _c1 _dCynthia Snell |