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005 20240726104839.0
008 210408s2021 mau o 000 0 eng d
040 _aIEEEE
_beng
_erda
_epn
_cIEEEE
_dOCLCO
_dOCLCF
_dZ5A
_dUKAHL
_dNT
020 _a9781630818616
_q((electronic)l(electronic)ctronic)
050 0 4 _aTK7868
_b.P333 2021
049 _aMAIN
100 1 _aBrooks, Douglas,
_d1940-
_e1
245 1 0 _aPCB design guide to via and trace currents and temperatures /Douglas Brooks with Johannes Adam.
300 _a1 online resource
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _adata file
_2rda
504 _a2
505 0 0 _tIntroduction and Historical Background --
_tMaterials Used in PCBs --
_tResistivity and Resistance --
_tTrace Heating and Cooling --
_tIPC Curves --
_tThermal Simulations --
_tThermal Simulations --
_tVia Temperatures --
_tCurrent Densities in Vias --
_tThinking Outside the Boxes --
_tFusing Currents: Background --
_tFusing Currents: Analyses --
_tDo Traces Heat Uniformly? --
_tStop Thinking about Current Density --
_tAC Currents --
_tIndustrial CT (X-Ray) Scanning --
_tMeasuring Thermal Conductivity --
_tMeasuring Resistivity --
_tIPC Internal and Vacuum Curves Fitted wi --
_tCurrent/Temperature Curves, 0.25 to 5.0 --
_tCurrent Density in Vias --
_tDerivation of Onderdonk's Equation --
_tResults of All Six Fusing Configuration --
_tNonuniform Heating Patterns.
520 0 _aA very important part of printed circuit board (PCB) design involves sizing traces and vias to carry the required current. This exciting new book will explore how hot traces and vias should be and what board, circuit, design, and environmental parameters are the most important. PCB materials (copper and dielectrics) and the role they play in the heating and cooling of traces are covered. The IPC curves found in IPC 2152, the equations that fit those curves and computer simulations that fit those curves and equations are detailed. Sensitivity analyses that show what happens when environments are varied, including adjacent traces and planes, changing trace lengths, and thermal gradients are presented. Via temperatures and what determines them are explored, along with fusing issues and what happens when traces are overloaded. Voltage drops across traces and vias, the thermal effects going around right-angle corners, and frequency effects are covered. Readers learn how to measure the thermal conductivity of dielectrics and how to measure the resistivity of copper traces and why many prior attempts to do so have been doomed to failure. Industrial CT Scanning, and whether or not they might replace microsections for measuring trace parameters are also considered.
530 _a2
_ub
650 0 _aPrinted circuits
_xDesign and construction.
655 1 _aElectronic Books.
700 1 _aAdam, Johannes,
_e1
856 4 0 _zClick to access digital title | log in using your CIU ID number and my.ciu.edu password.
_uhttpss://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2945408&site=eds-live&custid=s3260518
942 _cOB
_D
_eEB
_hTK.
_m2021
_QOL
_R
_x
_8NFIC
_2LOC
994 _a92
_bNT
999 _c80321
_d80321
902 _a1
_bCynthia Snell
_c1
_dCynthia Snell