000 | 03205cam a2200373Mi 4500 | ||
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001 | on1246582541 | ||
003 | OCoLC | ||
005 | 20240726104837.0 | ||
008 | 210417s2021 gw o ||| 0 eng d | ||
040 |
_aEBLCP _beng _erda _cEBLCP _dYDX _dSFB _dOCLCQ _dNT |
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020 | _a3736963963 | ||
020 |
_a9783736963962 _q((electronic)l(electronic)ctronic) |
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050 | 0 | 4 |
_aTA1700 _b.E658 2021 |
049 | _aMAIN | ||
100 | 1 |
_aKaul, Thorben. _e1 |
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245 | 1 | 0 | _aEpitaxial Design Optimizations for Increased Efficiency in GaAs-Based High Power Diode Lasers |
300 | _a1 online resource (137 pages). | ||
336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_adata file _2rda |
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490 | 1 |
_aInnovationen mit Mikrowellen und Licht. Forschungsberichte aus dem Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik ; _vv.62 |
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500 | _aDescription based upon print version of record. | ||
504 | _a2 | ||
505 | 0 | 0 |
_aIntro -- _tContents -- _tList of Publications -- _tAbstract -- _tKurzfassung -- _t1 Introduction -- _t1.1 Structure and method of this work -- _t2 Fundamentals -- _t2.1 Laser technology and market context -- _t2.2 Fabrication technology -- _t2.3 Mathematical framework of semiconductor lasers -- _t2.4 Parameters for characterization of broad area diode lasers -- _t2.5 Simulation tools -- _t2.6 Device configurations and measurement setups -- _t3 Literature Review, Prior State of the Art and Target Specifications -- _t3.1 Power and efficiency limiting effects -- _tan overview -- _t3.2 Target specifications -- _t3.3 Prior state of the art high power diode lasers and laser bars -- _t4 Novel Epitaxial Layer-Stack Design for Increased Efficiency -- _t4.1 General epitaxial design considerations -- _t4.2 Prior state of the art epitaxial design concepts and their limits -- _t4.3 ETAS: The novel extreme triple asymmetric design concept -- _t5 Diagnosis and Analysis of Power Limiting Mechanisms -- _t5.1 Devices designed and used for diagnosis -- _t5.2 Quantifying thermal- and bias-driven contributions to rollover -- _t5.3 Bias-driven power limitations -- _t5.4 Thermal-driven power limitations -- _t6 Performance of Diode Lasers Using Optimized VerticalDesigns -- _t6.1 Impact of optical confinement on T0 and T1 -- _t6.2 Measurement results of diode laser bars -- _t6.3 Short-term perspective for further improved performance -- _t7 Conclusion and Outlook -- _t7.1 The role of optical loss in thermal power saturation -- _t7.2 The role of internal differential quantum efficiency in thermal power saturation -- _t7.3 Performance of optimized devices using the novel ETAS design -- _t7.4 Outlook -- _t8 Acknowledgements -- _tA Appendix -- _tB List of Abbreviations -- _tBibliography. |
530 |
_a2 _ub |
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650 | 0 | _aSemiconductor lasers. | |
650 | 0 | _aDiodes. | |
655 | 1 | _aElectronic Books. | |
856 | 4 | 0 |
_zClick to access digital title | log in using your CIU ID number and my.ciu.edu password. _uhttpss://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2910466&site=eds-live&custid=s3260518 |
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_cOB _D _eEB _hTA _m2021 _QOL _R _x _8NFIC _2LOC |
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_a92 _bNT |
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_c80209 _d80209 |
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902 |
_a1 _bCynthia Snell _c1 _dCynthia Snell |